Table 1.
Plutonium Source Exposures of LR-115/II
Etch
£6¢
Sample
Degrader
Net
Time
Etch Temp.
Blank
59.7 + 0.6}
0.22
2461
3180
77
M
(min.)
(°C)
(Tracks/mm*)
Sample
Tracks
Incident*
Alphas
Efficiency
(%)
Method**
x
-0005" Mylar
92
XIV
-0005" Mylar
90
~ 60.0
0.04
2162
3180
68
M
XVIII
.0005" Mylar
90
~ 60.0
0.12
2349
3180
74
M
(XVIIT)
.0005" Mylar
90
~v 60.0
KKK
2689
. 3180
85
TA
XXIX
.0005" Mylar
90
59.8 + 0.4)
0.43
2880
3180
91
IA
XXX
.0005" Mylar
90
60.2 + 0.9
0.69
2317
3500
66
TA
XXXITI
.0005" Mylar}
90
61.7 + 0.4]
0.93
1944
3180
61
TA
90
60.1 + 0.4[
0.13
5143
RKKK
90
57.0 + 0.41
0.03
1264
3500
XXXIV
XXXV
XXXVIII}
none
1.8 cm air
.0005" Mylar}
90
60.1 + 0.4 0.20
133.
[1.4 x 10° <o.1
TA
36
NOTES:
*Incident alphas calculated from source strength, exposure time, and geometric factors.
**kM = visual count by microscope; IA = automatic scanning image analysis.
*k*kNot determined; visually measured background used to calculate net tracks.
*kKANOt calculated because of exposure area uncertainty.
See Figure 3.
TA
IA